User:Paulscottmartin/sandbox
ASLT - is a acronym representing
A-mbient
S-tress
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L-ife
T-est
In testing, usually with Highly Accelerated Life Testing (HALT) or similar type testing, it is sometimes desirable to test a device without stress. This can be particularly useful for electronic devices when you suspect the device of having flaws that may develop without being stressed.
This method will allow the test engineer to place the device to be tested in the location where it will be tested, but in the absence of stress. This test usually needs to run for an overnight period or over a weekend so as to determine if components or subsystems are failing due to HALT or if they would simply fail due to other causes.