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Talk:In-circuit testing

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This is an old revision of this page, as edited by Miffo7uk (talk | contribs) at 16:08, 26 April 2010 (Merge proposal). The present address (URL) is a permanent link to this revision, which may differ significantly from the current revision.

Merge proposal

I concur that Fixtureless_in-circuit_test and flying_probe should be meged into in-circuit test. Pro crast in a tor (talk) 19:32, 13 March 2010 (UTC)[reply]


I believe there are enough differences to justify separate sections with links. Flying Probe uses some incircuit techniques but has limitations. The big difference is the mechanical issues of accessing loaded PCB’s. Incircuit test (ICT) should included discussion about MDA’s and combinational test.