Automatic Test Pattern Generation
Automatic Test Pattern Generation (ATPG) is a software technique for creating specialized test patterns for scan-based semiconductor devices. Software tools that employ ATPG may also employ software fault diagnostics for the purpose of narrowing down the area of search for a semiconductor device failure.[1] Although ATPG and fault diagnostic functions are often incorporated into the same software tool, they are not required to be.
Notes
- ^ Crowell, G. "Using Scan Based Techniques for Fault Isolation in Logic Devices". Microelectronics Failure Analysis. pp. pp. 132-8.
{{cite conference}}:|pages=has extra text (help); Unknown parameter|booktitle=ignored (|book-title=suggested) (help); Unknown parameter|coauthors=ignored (|author=suggested) (help)
References
- Microelectronics Failure Analysis. Materials Park, Ohio: ASM International. 2004. ISBN 0-87170-804-3.
 | This technology-related article is a stub. You can help Wikipedia by expanding it. |