Geometric phase analysis
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Geometric phase analysis is a digital signal processing method used with Fast Fourier transform algorithms in high-resolution transmission electron microscopy images to quantify displacement and strain fields in crystalline lattices at nanoscale resolution.[1][2]
References
- ^ Hytch, M.J. (1998). "Quantitative measurement of displacement and strain fields from HREM micrographs". Ultramicroscopy. 74 (3): 131–146. doi:10.1016/s0304-3991(98)00035-7.
- ^ Kumar, Challa S.S.R., ed. (2014). Transmission Electron Microscopy Characterization of Nanomaterials. Springer. ISBN 978-3642389337.
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