Fault coverage
Fault coverage refers to the percentage of some type of fault that can be detected during the test of an electronic system, usually an integrated circuit. High fault coverage is particularly valuable during manufacturing test, and techniques such as Design For Test (DFT) are used to increase it.
Fault coverage refers to the percentage of some type of fault that can be detected during the test of an electronic system, usually an integrated circuit. High fault coverage is particularly valuable during manufacturing test, and techniques such as Design For Test (DFT) are used to increase it.
Bold textFault coverage in Synopsys Hardware Model Verification: Bold text The LMMT tool checks for faults by sticking each pin of the hardware model to logic '0' and logic '1', respectively, and runs the vectors captured during the "simulation run". Let me explain the process in detail. After building the model the functionality of the device is achieved with running scripts written in Verilog in suitable simulator (e.g. VCS), and vectors are captured. Captured vectors list all the logic levels of all inputs and sampled levels of all outputs and IOs. When these vectors are played alone, the input part of the vector is presented to the device model and the output portion is compared for the expected (or captured) response in the vectors. In fault coverage, in particular, while presenting these input vectors to the device, all the pins (one at-a-time) are "stick-to" logic level "0" and then "1". This means total number of vector plays that will be run are equatated to: total no. of vector plays = number of input pins * 2 Now to check for the fault, is just to check for the discrepancy which might arise between the sampled and expected (or captured) responce in the vectors, while playing the vectors. Faults for that pin are said to be covered only when pin "stuck-at-0" and "stuck-at-1" faults are found. This test when passes for all the pins, the device model fault coverage test is said to have passed. --akhil 07:04, 11 October 2006 (UTC)Akhilesh Patil--akhil 07:04, 11 October 2006 (UTC)
