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Robustness validation

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This sandbox is in the article namespace. Either move this page into your userspace, or remove the {{User sandbox}} template. Robustness validation is a skills strategy with which the robustness of a product to the loading conditions of a real application is proven and targeted statements about risks and reliability can be made. This strategy is particularly for use in the automotive industry however could be applied to any industry where high levels of reliability are required

History

At the beginning of the 1970s a relatively high failure rates of electronic components were tolerable in automobiles, because they replaced mechanical components, which had a much higher failure rate. The underlying failure rates of bimetallic flashers were 10% per year and the lifetime of mechanical ignition contacts at 10,000 miles. With the increasing number of semiconductors in control unitss, and the introduction of the first safety systems ( ABS) in the 70s had to be addressed. Already in 1975, the General Specification for IC's in Automotive Applications [1] as the first SAE Recommendation was issued, the 1978 SAE standard [2] was declared and adopted by major semiconductor manufacturers.

The establishment of the Automotive Electronic Council ( AEC) 1994 by Ford, Chrysler, GM - Delco was also the Starting point for the AEC-Q100 qualification process [3], was based on the SAE standards.

Due to the development of automotive and the ever-increasing complexity of vehicles associated with the demands for lower error rates of this qualification process , this process to decide by nonspecific tests, to cover a wide range of possible failure mechanisms, but only on the functionality of the component is out of date. In order to make statements about the robustness AEC Q100 can be replaced robustness validation.

  1. ^ General Specification for ICs in Automotive Applications, SAE Recommendation, 1975
  2. ^ General Specification for ICs in Automotive Applications, SAE standard, 1978,
  3. ^ Automotive Electronic Council's Stress Test Qualification for Integrated Circuits, AEC Q100, Rev. G, 2007, to aecouncil.com