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Correlated double sampling

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This is an old revision of this page, as edited by Jerryobject (talk | contribs) at 10:51, 16 January 2012 (WP:MOSCAPS, WP:LOWERCASE: non-proper nouns decapitalized; mea culpa: should have seen and done this in my prior edit.). The present address (URL) is a permanent link to this revision, which may differ significantly from the current revision.

Correlated double dampling (CDS) is a method to measure electrical values such as voltages or currents that allows removing an undesired offset. It is used often when measuring sensor outputs. The output of the sensor is measured twice: once in a known condition and once in an unknown condition. The value measured from the known condition is then subtracted from the unknown condition to generate a value with a known relation to the physical quantity being measured.

This is commonly used in switched capacitor operational amplifiers to effectively double the gain of the charge sharing opamp, while adding an extra phase.