Feature-oriented scanning
Feature-oriented scanning (FOS)[1][2][3] is a method intended for high-precision measurement of nanotopography as well as other surface properties and characteristics on a scanning probe microscope (SPM) using features (objects) of the surface as reference points of the microscope probe. With this method, during successive passings from one surface feature to another one located nearby, the relative distance between the features and the topography of their neighborhoods called surface segments are measured. Such approach permits to scan the required area of the surface by parts and then reconstruct the whole image from the obtained fragments. Beside the mentioned, it is acceptable to use another name for the method — object-oriented scanning (OOS).
See also
References
- ^ R. V. Lapshin (2004). "Feature-oriented scanning methodology for probe microscopy and nanotechnology" (PDF). Nanotechnology. 15 (9). UK: IOP: 1135–1151. Bibcode:2004Nanot..15.1135L. doi:10.1088/0957-4484/15/9/006. ISSN 0957-4484.
- ^ R. V. Lapshin (2007). "Automatic drift elimination in probe microscope images based on techniques of counter-scanning and topography feature recognition" (PDF). Measurement Science and Technology. 18 (3). UK: IOP: 907–927. Bibcode:2007MeScT..18..907L. doi:10.1088/0957-0233/18/3/046. ISSN 0957-0233.
- ^ R. V. Lapshin (2009). "Availability of feature-oriented scanning probe microscopy for remote-controlled measurements on board a space laboratory or planet exploration rover" (PDF). Astrobiology. 9 (5). USA: Mary Ann Liebert: 437–442. Bibcode:2009AsBio...9..437L. doi:10.1089/ast.2007.0173. ISSN 1531-1074. PMID 19566423.
External links
- Feature-oriented scanning, Research section at Lapshin's Personal Page on SPM & Nanotechnology
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