Surface and Interface Analysis
| File:SIA cover.gif | |
| Discipline | Chemistry |
|---|---|
| Language | English |
| Publication details | |
| History | 1979 to present |
| Publisher | |
| Standard abbreviations | |
| ISO 4 | Surf. Interface Anal. |
| Indexing | |
| ISSN | 1096-9918 |
| Links | |
Surface and Interface Analysis is a peer-reviewed scientific journal published by John Wiley & Sons since 1979. In thirteen issues per year, it publishes original research papers dealing with the development and application of techniques for the characterization of surfaces, interfaces and thin films. It is available both online and in print.
The current editor in chief is John F. Watts (University of Surrey).[1]
Highest cited papers
- Research Article: 'Calculations of electron inelastic mean free paths. V. Data for 14 organic compounds over the 50-2000 eV range', S. Tanuma, C. J. Powell, D. R. Penn 21(3):165-176 (MAR 1994). Cited 288 times [2].
- Research Article: 'Calculations of electron inelastic mean free paths (IMFPS). IV. Evaluation of calculated IMFPs and of the predictive IMFP formula TPP-2 for electron energies between 50 and 2000 eV', S. Tanuma, C. J. Powell, D. R. Penn 20(1):77-89 (JAN 1993). Cited 168 times [2].
- Research Article: 'Elastic Scattering Corrections in AES and XPS. II. Estimating Attenuation Lengths and Conditions Required for their Valid Use in Overlayer/Substrate Experiments', P. J. Cumpson, M. P. Seah 25(6)430-446 (JUN 1997). Cited 128 times [2].
- Research Article: 'Accuracy of the non-destructive surface nanostructure quantification technique based on analysis of the XPS or AES peak shape ', S. Tougaard 26(4):249-269 (APR 1998). Cited 95 times [2].
Abstracting and indexing information
The 2007 Impact Factor is 1.036, ranking the journal 76th out of 110 in the Physical Chemistry category.[3] Surface and Interface Analysis is indexed by Chemical Abstracts Service, SciFinder, Scopus, and Web of Science.[1]