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Serial Vector Format

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Serial Vector Format (SVF) is a vector exchange format[clarification needed], designed to enable transfer of boundary scan vectors[clarification needed] between tools. SVF is expressing test patterns[clarification needed] that represent the stimulus, expected response, and mask data[clarification needed] for IEEE 1149.1-based (JTAG) tests. The standard was jointly developed by Texas Instruments and Teradyne. Control over the format has been handed off to boundary-scan solution provider ASSET InterTech. The most recent revision is March 1999.

The SVF file is defined as an ASCII file that consists of a set of SVF statements. The maximum number of characters allowed on a line is 256, although one SVF statement can span more than one line. Each statement consists of a command and associated parameters. Each SVF statement is terminated by a semicolon. SVF is not case sensitive. Comments can be inserted into a SVF file after an exclamation point ‘!’ or a pair of slashes ‘//’. Either ‘//’ or ‘!’ will comment out the remainder of the line.


SVF Commands

  • ENDDR: Specifies default end state for DR scan operations.
  • ENDIR: Specifies default end state for IR scan operations.
  • FREQUENCY: Specifies maximum test clock frequency for IEEE 1149.1 bus operations.
  • HDR: (Header Data Register) Specifies a header pattern that is prepended to the beginning of subsequent DR scan operations.
  • HIR: (Header Instruction Register) Specifies a header pattern that is prepended to the beginning of subsequent IR scan operations.
  • PIO: (Parallel Input/Output) Specifies a parallel test pattern.
  • PIOMAP: (Parallel Input/Output Map) Maps PIO column positions to a logical pin.
  • RUNTEST: Forces the IEEE 1149.1 bus to a run state for a specified number of clocks or a specified time period.
  • SDR: (Scan Data Register) Performs an IEEE 1149.1 Data Register scan.
  • SIR: (Scan Instruction Register) Performs an IEEE 1149.1 Instruction Register scan.
  • STATE: Forces the IEEE 1149.1 bus to a specified stable state.
  • TDR: (Trailer Data Register) Specifies a trailer pattern that is appended to the end of subsequent DR scan operations.
  • TIR: (Trailer Instruction Register) Specifies a trailer pattern that is appended to the end of subsequent IR scan operations.
  • TRST: (Test ReSeT) Controls the optional Test Reset line.

References

  • The In-System Configuration Handbook: A Designer's Guide to ISC, Neil G. Jacobson, ISBN 1-4020-7655-X