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Feature-oriented positioning

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Feature-oriented positioning (FOP)[1] is a method of precise movement of the scanning microscope probe across the surface under investigation. With this method, surface features[1] are used as reference points (points of probe attachment). Actually, FOP is a simplified variant of the feature-oriented scanning (FOS).[1] With FOP, no topographical image of a surface area is acquired. Instead, a probe movement by surface features is only carried out from the start point A (neighborhood of the start feature) to the destination point B (neighborhood of the destination feature) along some route that goes through intermediate features of the surface. The method may also be referred to by another name — object-oriented positioning (OOP).

See also

References

  1. ^ a b c R. V. Lapshin, “Feature-oriented scanning methodology for probe microscopy and nanotechnology”, Nanotechnology, volume 15, issue 9, pages 1135-1151, 2004.
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