Automatic test pattern generation

Automatic Test Pattern Generation (ATPG) systems are tools for generating tests for digital circuits after they are produced.

Testing very large scale integrated circuits with a high fault coverage is a hard task because of their complexity. Different ATPG methods have to be applied to combinational and sequential circuits.

See also:

• Design for Test (DFT)
• Fault model
• ASIC
• VHSIC