Surface and Interface Analysis

*Surface and Interface Analysis*
	File:SIA cover.gif
Discipline	Chemistry
Language	English
Publication details
History	1979 to present
Publisher	John Wiley & Sons ( United Kingdom)
Standard abbreviations;
ISO 4	SIA
Indexing;
ISSN	[https://www.worldcat.org/search?fq=x0:jrnl&q=n2:0142-2421 0142-2421 (Print); 1096-9918 (Web) 0142-2421 (Print); 1096-9918 (Web)];
Links
	Journal homepage;

Surface and Interface Analysis (usually abbreviated as SIA), is a peer-reviewed scientific journal, published since 1979 by John Wiley & Sons. In 13 issues per year, it publishes papers dealing with the development and application of techniques for the characterization of surfaces, interfaces and thin films. Papers dealing with standardization and quantification are particularly welcome, and also those which deal with the application of these techniques to industrial problems. Papers dealing with the purely theoretical aspects of the technique will also be considered. Review articles will be published; prior consultation with one of the Editors is advised in these cases. Papers must clearly be of scientific value in the field and will be submitted to two independent referees. Contributions must be in English and must not have been published elsewhere, and authors must agree not to communicate the same material for publication to any other journal. Authors are invited to submit their papers for publication to John Watts (UK only), Jose Sanz (Rest of Europe), John T. Grant (all non-European countries, except Japan) or R. Shimizu (Japan only).

Audience/Readership

Materials Scientists · Physicists · Physical Chemists · Scientists interested in Microelectronics, Organometallic Chemistry, Catalysis and Surface Analysis · Surface Engineers

Audience/Readership

See also