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Design Automation and Test in Europe

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DATE, Design Automation and Test in Europe
StatusActive
FrequencyAnnual
Years active27
FoundedFebruary 1998; 27 years ago (1998-02) in Paris, France
Next eventDATE2025 in Lyon, France
Participants1200
AreaElectronic design automation
SponsorsACM Special Interest Group on Design Automation (SIGDA), the Electronic System Design Alliance (ESDA), the European Design and Automation Association (EDAA), and the IEEE Council on Electronic Design Automation (CEDA)
WebsiteDATE

Design, Automation & Test in Europe, or DATE is a yearly conference on the topic of electronic design automation. It is typically held in March or April of each year, alternating between France and Germany.[1][2] It is sponsored by the SIGDA of the Association for Computing Machinery, the Electronic System Design Alliance, the European Design and Automation Association (EDAA),[3] and the IEEE Council on Electronic Design Automation (CEDA). Technical co-sponsors include ACM SIGBED, the IEEE Solid-State Circuits Society (SSCS), IFIP, and the Institution of Engineering and Technology (IET).

DATE is a combination of a technical conference and a small trade show. It was formed in 1998 as a merger of EDAC, ETC, Euro-ASIC, and Euro-DAC.[4]

Areas of Submission

The DATE conference invites research papers in many areas related to electronic design automation. These topics are grouped into four main tracks: design methods, applications, testing, and embedded systems.[5]

Track D:[6] Design Methods and Tools covers research on how to build better design tools and methods. Topics include high-level synthesis, system simulation, formal verification, low-power and secure design, reconfigurable systems, and new ideas like quantum computing and approximate computing.

Track A:[7] Application Designfocuses on real-world examples. It includes designs for smart energy systems, secure and autonomous systems, artificial intelligence, and new technologies used in practical ways.

Track T:[8] Test and Dependability is about testing and reliability. It includes fault detection, circuit testing, secure system validation, and ways to make sure systems work even when there are errors.

Track E:[9] Embedded Systems Design includes software and hardware for embedded and cyber-physical systems. Topics cover real-time systems, secure systems, software tools, and using machine learning in embedded devices.

Each track has several specific topics. Authors can choose the one that fits their work. All papers are peer-reviewed and must present original and useful research.

Young People Programme

The DATE conference hosts the Young People Programme, an initiative aimed at supporting early-career researchers and strengthening academic-industry connections. First introduced in 2019, the program offers career development resources for master’s students, PhD candidates, and postdoctoral researchers. It also provides a platform for companies and universities to engage with emerging talent. The programme includes networking events, mentorship opportunities, and recruiting activities to help participants explore career paths and build professional relationships.[10]

Conference Archive

The following table lists past editions of the DATE (Design, Automation and Test in Europe) conference, including the host cities and years. A full archive of events and proceedings is available on the official DATE website.[11] Additional bibliographic information is available through the DBLP computer science bibliography.[12] Proceedings for each year are accessible via IEEE Xplore.[13]

Year Location Proceedings
2025 Lyon, France IEEE Xplore[13]
2024 Valencia, Spain IEEE Xplore[13]
2023 Antwerp, Belgium IEEE Xplore[13]
2022 Antwerp, Belgium IEEE Xplore[13]
2021 Grenoble, France IEEE Xplore[13]
2020 Grenoble, France IEEE Xplore[13]
2019 Florence, Italy IEEE Xplore[13]
2018 Dresden, Germany IEEE Xplore[13]
2017 Lausanne, Switzerland IEEE Xplore[13]
2016 Dresden, Germany IEEE Xplore[13]
2015 Grenoble, France IEEE Xplore[13]
2014 Dresden, Germany IEEE Xplore[13]
2013 Grenoble, France IEEE Xplore[13]
2012 Dresden, Germany IEEE Xplore[13]
2011 Grenoble, France IEEE Xplore[13]
2010 Dresden, Germany IEEE Xplore[13]
2009 Nice, France IEEE Xplore[13]
2008 Munich, Germany IEEE Xplore[13]
2007 Nice, France IEEE Xplore[13]
2006 Munich, Germany IEEE Xplore[13]
2005 Munich, Germany IEEE Xplore[13]
2004 Paris, France IEEE Xplore[13]
2003 Munich, Germany IEEE Xplore[13]
2002 Paris, France IEEE Xplore[13]
2001 Munich, Germany IEEE Xplore[13]
2000 Paris, France IEEE Xplore[13]
1999 Munich, Germany IEEE Xplore[13]
1998 Paris, France IEEE Xplore[13]

Late Breaking Results

The DATE conference offers a special track for Late Breaking Results (LBR). This track allows researchers to share new ideas, early-stage findings, or innovative directions that are still in progress. LBR submissions are limited to two pages and must follow the official template. All submissions are reviewed through a blind peer-review process. Selected papers are presented in interactive sessions, where authors can receive feedback and discuss their work with the community.[5]

See also

References

  1. ^ Proceedings of the 2022 Design, Automation & Test in Europe Conference & Exhibition (DATE 2022). European Design and Automation Association. 2022. ISBN 978-3-9819263-6-1. OCLC 1327747814.
  2. ^ "Design, Automation, and Test in Europe proceedings 1998-2023 | Association for Computing Machinery Digital Library". dl.acm.org/conference/date.
  3. ^ "European Design and Automation Association | home page". www.edaa.com.
  4. ^ Proceedings of the conference on Design, automation, and test in Europe (DATE 1998). IEEE Computer Society. 1998. ISBN 978-0-8186-8359-6. OCLC 1112536591.
  5. ^ a b DATE Conference – Call for Papers
  6. ^ Track D – DATE Technical Program Committee
  7. ^ Track A – DATE Technical Program Committee
  8. ^ Track T – DATE Technical Program Committee
  9. ^ Track E – DATE Technical Program Committee
  10. ^ DATE Conference – Young People Programme
  11. ^ DATE Conference Archive
  12. ^ DBLP – DATE Conference Proceedings Archive
  13. ^ a b c d e f g h i j k l m n o p q r s t u v w x y z aa ab ac IEEE Xplore Digital Library


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