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Active Power Cycling / Power Cycling Test (PCT) is a accelerated lifetime test for electronic power semiconductors devices and modules. Similar to temperature cycle testing it stresses the interconnect interfaces of the various materials involved by repetative temperature changes - however the temperature rise ΔT is generated by self-heating of the electronic device with an external load current IL.
Background
Thermomechanic strain is generated in materials and interfaces due to temperature gradients as well as temperature changes and their differences in thermal expansion thus leading to thermo-mechanical fatigue. Even for small amplitudes this strain will accumulate (low-cycle fatigue) leading to material fatigue and device failures.
The thermomechanical, time-dependant stress profile generated by the electrical application is converted into test specifications for the power cycling test verifying the resilience of that power devices resp. modules.[1] The increasing interest in the test method is driven by power modules used in electric vehicles' drive-train and the specific test requirements of automotive industry.[2]
- ^ IEC 60749-34:2010 Semiconductor devices - Mechanical and climatic test methods - Part 34: Power cycling
- ^ "Automotive AQG 324". ecpe.org.