User:JL-IISB/sandbox
Active Power Cycling / Power Cycling Test (PCT) is a lifetime test for electronic power semiconductors devices and modules. Similar to temperature cycle testing it stresses the interconnect interfaces of the various materials involved by repetative temperature changes - however the temperature rise ΔT is generated by self-heating of the electronic device with an external load current IL.
Background
Thermomechanic strain is generated in materials and interfaces due to temperature gradients and changes due to their differences in thermal expansion thus leading to thermo-mechanical fatigue. Even for small amplitudes this strain will accumulate (low-cycle fatigue) thus leading to material and device failures in test resp. application.