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Active Power Cycling / Power Cycling Test (PCT)
Active Power Cycling Test is a lifetime test[1] for electronic power semiconductors devices[2] and modules[3]. Similar to temperature cycle testing[4] it stresses the interconnect interfaces of the various materials involved by repetative temperature changes - however the temperature rise ΔT is generated by self-heating of the electronic device itself by an external load current IL.
Background
Thermomechanic stress is generated in materials and interfaces due to temperature gradients and changes due to their differences in thermal expansion[5].
It is by thermomechnic strains due to their mismatch of thermal expantion stress terveals It stresses is