Critical area (computing)

In integrated circuit design, a critical area is a section of a circuit design wherein a particle of a particular size can cause a failure.^[1] It measures the sensitivity of the circuit to a reduction in yield.^[2]

References

^ D. M. H. Walker (1992). "Critical area analysis". Proceedings International Conference on Wafer Scale Integration. IEEE: 281–290. doi:10.1109/ICWSI.1992.171820.
^ A. V. Ferris-Prabhu (1985). "Modeling the critical area in yield forecasts". IEEE Journal of Solid-State Circuits. 20 (4). IEEE: 874–878. doi:10.1109/JSSC.1985.1052403.

This technology-related article is a stub. You can help Wikipedia by expanding it.

[1] D. M. H. Walker (1992). "Critical area analysis". Proceedings International Conference on Wafer Scale Integration. IEEE: 281–290. doi:10.1109/ICWSI.1992.171820.

[2] A. V. Ferris-Prabhu (1985). "Modeling the critical area in yield forecasts". IEEE Journal of Solid-State Circuits. 20 (4). IEEE: 874–878. doi:10.1109/JSSC.1985.1052403.

[1]

[2]