FAN algorithm
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FAN algorithm is an algorithm for automatic test pattern generation (ATPG). It was invented in 1983 by Fujiwara et al.,[1] which was the fastest ATPG algorithm at that time and was adopted by industry. The FAN algorithm succeeded in reducing the number of backtracks by adopting new heuristics such as unique sensitization and multiple backtracing.[1]
References
- ^ a b Fujiwara, Hideo; Shimono, Takeshi (December 1983). "On the acceleration of test generation algorithm". IEEE Trans. on Computers. C-32 (12): 1137–1144. doi:10.1109/TC.1983.1676174.