| Display title | Electron backscatter diffraction |
| Default sort key | Electron backscatter diffraction |
| Page length (in bytes) | 126,609 |
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| Page ID | 1678541 |
| Page content language | en - English |
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| Wikidata item ID | Q1326017 |
| Local description | Scanning electron microscopy technique |
| Central description | Method for material analysis. Backscattered electrons (BSEs) are produced by elastic collisions with atoms from the sample. BSEs produce an image that is related to material composition and orientation providing both spatial and chemical information. |
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| Page creator | 81.154.14.219 (talk) |
| Date of page creation | 13:44, 1 April 2005 |
| Latest editor | Arun 01 (talk | contribs) |
| Date of latest edit | 15:27, 24 April 2025 |
| Total number of edits | 401 |
| Recent number of edits (within past 30 days) | 2 |
| Recent number of distinct authors | 1 |
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