| Display title | Deep-level transient spectroscopy |
| Default sort key | Deep-level transient spectroscopy |
| Page length (in bytes) | 17,656 |
| Namespace ID | 0 |
| Page ID | 1670347 |
| Page content language | en - English |
| Page content model | wikitext |
| Indexing by robots | Allowed |
| Number of page watchers | Fewer than 30 watchers |
| Number of redirects to this page | 2 |
| Counted as a content page | Yes |
| Wikidata item ID | Q176282 |
| Central description | experimental tool for studying electrically active defects in semiconductors |
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| Page creator | Prgo (talk | contribs) |
| Date of page creation | 16:14, 30 March 2005 |
| Latest editor | InternetArchiveBot (talk | contribs) |
| Date of latest edit | 21:04, 23 January 2024 |
| Total number of edits | 182 |
| Recent number of edits (within past 30 days) | 0 |
| Recent number of distinct authors | 0 |
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